SAYURI-PV 2025: The biggest reliability risks facing today's modules

Organized by AIST’s Renewable Energy Advanced Research Center (READ), the SAYURI-PV events brings together global experts to tackle the most pressing issues in module aging, failure modes, and long-term field reliability. The 2025 event was held on Nov 5-6th in Tsukuba City, Japan.

Kiwa PVEL's Jean-Nicolas Jaubert, our Director of China Operations, delivered a presentation on emerging reliability trends, exploring how evolving PV technologies pose new stress challenges. Highlights include:

• The impact of bill-of-materials (BOM) variability on module durability

• Growing concerns around UV-induced degradation (UVID), especially in TOPCon and HJT modules

• How encapsulant choices and cell/passivation design influence long-term stability

To access a copy of the presentation, please click here.