Kiwa PVEL at CellTech 2025
October 7, 2025.
At PV CellTech USA 2025, Archana Sinha, Senior Engineer at Kiwa PVEL, delivered a compelling presentation on the emerging risk of UV-induced degradation (UVID) in high-efficiency solar modules. Drawing on Kiwa PVEL’s extensive lab testing of advanced cell architectures—such as TOPCon and HJT—she illuminated how prolonged ultraviolet exposure is already showing measurable power losses in modules, even before the full effects of aging are realised. Her talk underscored the vital importance of early detection of UV-vulnerability in module bills of materials (BOMs), the role of optimising encapsulants and backsheets, and pathways for manufacturers and developers to safeguard long-term performance and bankability in the U.S. market.